Multiple testing for particle picking in cryo-EM

The goal of this research is to design a computational framework for particle picking in single-particle cryo-electron microscopy (cryo-EM) based on fundamental statistical principles. This should be contrasted with many existing techniques in the cryo-EM field, which are based on different heuristics and are not supported by solid statistical or mathematical justifications.

To accomplish our aim, we develop two computational frameworks. The first approach is based on spatial multiple testing based on topological features. The second project studies the detection of particle's locations as a change point detection problem, which is a well-studied problem is time series analysis.